Display test and measurement
Display test and measurement
NXP Distributor's system expertise and large selection of reference designs allow engineers to design smarter, more robust Display test and measurement systems that create safer and efficient environments for Display test and measurement market.
NXP Featured Parts (2024/12/13):
- IC MCU 8BIT 16KB OTP 44PLCC
- IC REGISTER STATIC 64BIT 16SOIC
- IC MCU 32BIT 4MB FLASH 176LQFP
- IC MPU MPC8XX 75MHZ 256BGA
- IC MCU 8BIT 8KB FLASH 44QFP
- IC MCU 32BIT 256KB FLSH 121XFBGA
- IC TRNSLTR BIDIRECTIONAL 6XSON
- IC MCU 32BIT 768KB FLASH 144LQFP
- IC MCU 16BIT 256KB FLASH 64LQFP
- IC BUFFER/DRIVER OCTAL 24SOIC
- IC MCU 8BIT 32KB FLASH 20TSSOP
- IC MCU 8BIT 48KB FLASH 48LQFP
NXP Latest News:
- NXP Semiconductors announced the new MCX portfolio of microcontrollers
- NXP has announced two new processor families - the S32Z and S32E processor
- NXP announced expanded and strong customer engagements for its entire S32 family of domain and zonal
- NXP Semiconductors announced the OrangeBox automotive-grade development platform
- NXP Semiconductors announced new Matter™-enabled development platform
- NXP announced its collaboration with the German Aerospace Center (DLR) and other partners on ion tra
- NXP announced its new NXP analog front-end (N-AFE) family for high-precision data acquisition and co
- NXP announced a new S32K39 series of automotive MCUs optimized for electric vehicle (EV) control app
- NXP announced new devices designed to simplify the development of IoT and industrial IoT solutions
- NXP announced the i.MX 95 family, the newest addition to its i.MX 9 series of applications processor
- NXP announced a new industry-first 28nm RFCMOS radar one-chip IC family
- NXP announced market availability of the i.MX RT600 crossover microcontroller (MCU) family
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