
Display test and measurement

Display test and measurement
NXP Distributor's system expertise and large selection of reference designs allow engineers to design smarter, more robust Display test and measurement systems that create safer and efficient environments for Display test and measurement market.
NXP Featured Parts (2025/10/29):
- IC SYNC 4BIT BIN COUNTER 16TSSOP
- IC MCU 32BIT 1MB FLASH 144LQFP
- IC INTERFACE SPECIALIZED 64TFBGA
- 3 QUADRANT TRIAC
- IC MCU 32BIT ROMLESS 144LQFP
- DATA LINE FILTER
- IC FF D-TYPE SNGL 1BIT 6XSON
- IC MCU 8BIT 8KB FLASH 20SOIC
- IC ANALOG SWITCH SPDT 10XQFN
- IC MCU 32BIT 16KB FLASH 20TSSOP
- IC INVERTER OD 3CH 3-INP 8XSON
- IC MCU 32BIT 24KB FLASH 32HVQFN
NXP Latest News:
- NXP Semiconductors announced the new MCX portfolio of microcontrollers
- NXP has announced two new processor families - the S32Z and S32E processor
- NXP announced expanded and strong customer engagements for its entire S32 family of domain and zonal
- NXP Semiconductors announced the OrangeBox automotive-grade development platform
- NXP Semiconductors announced new Matter™-enabled development platform
- NXP announced its collaboration with the German Aerospace Center (DLR) and other partners on ion tra
- NXP announced its new NXP analog front-end (N-AFE) family for high-precision data acquisition and co
- NXP announced a new S32K39 series of automotive MCUs optimized for electric vehicle (EV) control app
- NXP announced new devices designed to simplify the development of IoT and industrial IoT solutions
- NXP announced the i.MX 95 family, the newest addition to its i.MX 9 series of applications processor
- NXP announced a new industry-first 28nm RFCMOS radar one-chip IC family
- NXP announced market availability of the i.MX RT600 crossover microcontroller (MCU) family

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