
Display test and measurement

Display test and measurement
NXP Distributor's system expertise and large selection of reference designs allow engineers to design smarter, more robust Display test and measurement systems that create safer and efficient environments for Display test and measurement market.
NXP Featured Parts (2025/4/30):
- IC MCU 16BIT 96KB FLASH 80QFP
- SBC 3V 1CAN 0LIN 6SG HLQFP48
- IC AMP CLASS AB STEREO 15W 9PDBS
- IC MCU 32BIT 256KB FLASH 80FQFP
- IC BUFFER 1.8V 28BIT SOT802
- IC INTERFACE SPECIALIZED 32SOIC
- IC CFL/TL DRIVER 100KHZ 20SO
- IC MCU 32BIT ROMLESS 100TFBGA
- NAND GATE, TTL
- IC MPU Q OR IQ 800MHZ 689TEBGA
- IC PWR SWITCH N-CH 1:16 32SOIC
- IC MCU 8BIT 60KB FLASH 32LQFP
NXP Latest News:
- NXP Semiconductors announced the new MCX portfolio of microcontrollers
- NXP has announced two new processor families - the S32Z and S32E processor
- NXP announced expanded and strong customer engagements for its entire S32 family of domain and zonal
- NXP Semiconductors announced the OrangeBox automotive-grade development platform
- NXP Semiconductors announced new Matter™-enabled development platform
- NXP announced its collaboration with the German Aerospace Center (DLR) and other partners on ion tra
- NXP announced its new NXP analog front-end (N-AFE) family for high-precision data acquisition and co
- NXP announced a new S32K39 series of automotive MCUs optimized for electric vehicle (EV) control app
- NXP announced new devices designed to simplify the development of IoT and industrial IoT solutions
- NXP announced the i.MX 95 family, the newest addition to its i.MX 9 series of applications processor
- NXP announced a new industry-first 28nm RFCMOS radar one-chip IC family
- NXP announced market availability of the i.MX RT600 crossover microcontroller (MCU) family

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